| 000 -LEADER |
| fixed length control field |
02065 a2200277 4500 |
| 003 - CONTROL NUMBER IDENTIFIER |
| control field |
Nust |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
| control field |
20220812111120.0 |
| 010 ## - LIBRARY OF CONGRESS CONTROL NUMBER |
| LC control number |
00043688 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
| International Standard Book Number |
0471384321 (cloth : alk. paper) |
| 040 ## - CATALOGING SOURCE |
| Transcribing agency |
Nust |
| 082 00 - DEWEY DECIMAL CLASSIFICATION NUMBER |
| Classification number |
621.38133,HAR |
| 100 1# - MAIN ENTRY--PERSONAL NAME |
| Personal name |
Hartnagel, Hans, |
| 9 (RLIN) |
96959 |
| 245 10 - TITLE STATEMENT |
| Title |
Microwave noise in semiconductor devices / |
| Statement of responsibility, etc. |
Hans Ludwig Hartnagel, Ramunas Katilius, Arvydas Matulionis. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. |
| Place of publication, distribution, etc. |
New York : |
| Name of publisher, distributor, etc. |
Wiley, |
| Date of publication, distribution, etc. |
c2001. |
| 300 ## - PHYSICAL DESCRIPTION |
| Extent |
xviii, 293 p. : |
| Other physical details |
ill. ; |
| Dimensions |
25 cm. |
| 505 ## - FORMATTED CONTENTS NOTE |
| Formatted contents note |
Introduction (Page-1), Kinetic Theory of Nonequilibrium Processes (Page-16), Fluctuations: Kinetic Theory (Page-25), Effect of Interelectron Collisions on Fluctuation Phenomena (Page-37), Boltzmann-Langevin Equation (Page-44), Fluctuations and Diffusion (Page-50), Features of Hot-Electron Fluctuation Spectra (Page-62), Experimental Techniques (Page-81), Hot-Electron Microwave Noise in Elementary Semiconductors (Page-96), Hot-Electron Microwave Noise in GaAs and InP (Page-116), Length-Dependent Hot-Electron Noise (Page-128), Hot-Electron Noise in Doped Semiconductors: Theory (Page-147), Electronic Noise in Standard-Doped n-Type GaAs (Page-161), Electron Diffusion in Standard-Doped n-Type GaAs (Page-175), Electronic Subbands in Quantum Wells (Page-181Hot-Electron Noise in ALGaAs/GaAs 2DEG Channels (Page-197), Hot-Electron Noise in InP-Based 2DEG Channels (Page-209), Cutoff Frequencies of Fast and Ultrafast Processes (Page-220), Spatially Inhomogeneous Fluctuations (Page-230), Monte Carlo Approach to Microwave Noise in Devices (Page-245), |
| Statement of responsibility |
|
| 511 ## - PARTICIPANT OR PERFORMER NOTE |
| Participant or performer note |
|
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
| Topical term or geographic name entry element |
Semiconductors. |
| 9 (RLIN) |
11016 |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
| Topical term or geographic name entry element |
Telecommunication Engineering. |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
| Personal name |
Katilius, Ramunas. |
| 9 (RLIN) |
96960 |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
| Personal name |
Matulionis, A. |
| Dates associated with a name |
1946- |
| 9 (RLIN) |
96961 |
| 856 42 - ELECTRONIC LOCATION AND ACCESS |
| Materials specified |
Contributor biographical information |
| Uniform Resource Identifier |
<a href="http://www.loc.gov/catdir/bios/wiley042/00043688.html">http://www.loc.gov/catdir/bios/wiley042/00043688.html</a> |
| 856 42 - ELECTRONIC LOCATION AND ACCESS |
| Materials specified |
Publisher description |
| Uniform Resource Identifier |
<a href="http://www.loc.gov/catdir/description/wiley034/00043688.html">http://www.loc.gov/catdir/description/wiley034/00043688.html</a> |
| 856 42 - ELECTRONIC LOCATION AND ACCESS |
| Materials specified |
Table of Contents |
| Uniform Resource Identifier |
<a href="http://www.loc.gov/catdir/toc/onix06/00043688.html">http://www.loc.gov/catdir/toc/onix06/00043688.html</a> |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
| Koha item type |
Reference |
| Source of classification or shelving scheme |
|