Electromigration and electronic device degradation / (Record no. 178591)
[ view plain ]
| 000 -LEADER | |
|---|---|
| fixed length control field | 01502 a2200229 4500 |
| 003 - CONTROL NUMBER IDENTIFIER | |
| control field | Nust |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20221128153729.0 |
| 010 ## - LIBRARY OF CONGRESS CONTROL NUMBER | |
| LC control number | 93016841 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 0471584894 (cloth : alk. paper) |
| 040 ## - CATALOGING SOURCE | |
| Transcribing agency | Nust |
| 082 00 - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.3815,ELE |
| 245 00 - TITLE STATEMENT | |
| Title | Electromigration and electronic device degradation / |
| Statement of responsibility, etc. | edited by Aris Christou. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Place of publication, distribution, etc. | New York : |
| Name of publisher, distributor, etc. | Wiley, |
| Date of publication, distribution, etc. | c1994. |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | xiv, 343 p. : |
| Other physical details | ill. ; |
| Dimensions | 25 cm. |
| 505 ## - FORMATTED CONTENTS NOTE | |
| Formatted contents note | Reliability and Electromigration Degradation of GaAs Microwave Monolithic Integrated Circuits (Page-1), Simulation and Computer Models for Electromigration (Page-27), Temperature Dependencies on Electromigration (Page-79), Electromigration and Related Failure Mechanisms in VLSI Metallizations (Page-105),Metallic Electromigration Phenomena (Page-139), Theoretical and Experimental Study of Electromigration (Page-167), GaAs on Silicon Performance and Reliability (Page-235),Electromigration and Stability of Multilayer Metal-Semiconductor Systems on GaAs (Page-263), Electrothermomigration Theory and Experiments in Aluminum Thin Film Metallizations (Page-291), Reliable Metallization for VLSI (Page-317). |
| Miscellaneous information | |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Telecommunication Engineering. |
| 700 1# - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Christou, A. |
| 9 (RLIN) | 103714 |
| 740 0# - ADDED ENTRY--UNCONTROLLED RELATED/ANALYTICAL TITLE | |
| Uncontrolled related/analytical title | Electromigration & electronic device degradation. |
| 856 42 - ELECTRONIC LOCATION AND ACCESS | |
| Materials specified | Publisher description |
| Uniform Resource Identifier | <a href="http://www.loc.gov/catdir/description/wiley032/93016841.html">http://www.loc.gov/catdir/description/wiley032/93016841.html</a> |
| 856 42 - ELECTRONIC LOCATION AND ACCESS | |
| Materials specified | Table of Contents |
| Uniform Resource Identifier | <a href="http://www.loc.gov/catdir/toc/onix03/93016841.html">http://www.loc.gov/catdir/toc/onix03/93016841.html</a> |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | Reference |
| Source of classification or shelving scheme | |
| Withdrawn status | Lost status | Source of classification or shelving scheme | Damaged status | Not for loan | Permanent Location | Current Location | Shelving location | Date acquired | Full call number | Barcode | Date last seen | Price effective from | Koha item type | Public note |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Military College of Signals (MCS) | Military College of Signals (MCS) | General Stacks | 12/12/2016 | 621.3815,ELE | MCS26470 | 12/08/2016 | 12/12/2016 | Book | Almirah No.32, Shelf No.6 |