LSI/VLSI testability design / (Record no. 183885)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 01099 a2200205 4500 |
| 003 - CONTROL NUMBER IDENTIFIER | |
| control field | Nust |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20230802133216.0 |
| 010 ## - LIBRARY OF CONGRESS CONTROL NUMBER | |
| LC control number | 86003005 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 0070653410 : |
| 040 ## - CATALOGING SOURCE | |
| Transcribing agency | Nust |
| 082 00 - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.395,TSU |
| 100 1# - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Tsui, Frank F. |
| 9 (RLIN) | 94517 |
| 245 10 - TITLE STATEMENT | |
| Title | LSI/VLSI testability design / |
| Statement of responsibility, etc. | Frank F. Tsui. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Place of publication, distribution, etc. | New York : |
| Name of publisher, distributor, etc. | McGraw-Hill, |
| Date of publication, distribution, etc. | c1987. |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | xv, 702 p. : |
| Other physical details | ill. ; |
| Dimensions | 24 cm. |
| 505 ## - FORMATTED CONTENTS NOTE | |
| Formatted contents note | Introduction (Page-1), Conventional Test Methods (Page-31), Problems In Testing (Page-52), Design For Testability (Page-75), Latch Scanning Arrangements (Page-102), Switching Of Input/ Output Ports (Page-136), Internal Pattern Generation And Response Compaction (Page-169), Isolation And Self Sufficiency (Page-213), Software And Equipment Supports (Page-260), Taking Stock And Looking Ahead (Page-313), A Penny For My Thoughts (Page-394), Future Of Test Engineering (Page-447). |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Integrated circuits |
| General subdivision | Large scale integration |
| -- | Testing. |
| 9 (RLIN) | 113895 |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Integrated circuits |
| General subdivision | Very large scale integration |
| -- | Testing. |
| 9 (RLIN) | 113896 |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Source of classification or shelving scheme | |
| Koha item type | Book |
| Call number prefix | 621.395,TSU |
| Withdrawn status | Lost status | Source of classification or shelving scheme | Damaged status | Not for loan | Permanent Location | Current Location | Shelving location | Date acquired | Full call number | Barcode | Date last seen | Price effective from | Koha item type | Public note |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Military College of Signals (MCS) | Military College of Signals (MCS) | General Stacks | 12/12/2016 | 621.395,TSU | MCS810 | 12/08/2016 | 12/12/2016 | Book | Almirah No.84, Shelf No.4 |