Entry Topical Term

Number of records used in: 1

001 - CONTROL NUMBER

• control field: 113895

003 - CONTROL NUMBER IDENTIFIER

• control field: NUST

005 - DATE AND TIME OF LATEST TRANSACTION

• control field: 20230802132518.0

008 - FIXED-LENGTH DATA ELEMENTS

• fixed length control field: 230802|| aca||aabn | a|a d

040 ## - CATALOGING SOURCE

• Original cataloging agency: NUST
• Transcribing agency: NUST

150 ## - HEADING--TOPICAL TERM

• Topical term or geographic name entry element: Integrated circuits
• General subdivision: Large scale integration
• General subdivision: Testing

670 ## - SOURCE DATA FOUND

• Source citation: Work cat.: (NUST)183885: Tsui, Frank F. 94517, LSI/VLSI testability design / , c1987.