Normal view
MARC view
- Failure mechanism in semiconductor devices
Entry Topical Term
001 - CONTROL NUMBER
- control field: 127307
003 - CONTROL NUMBER IDENTIFIER
- control field: NUST
005 - DATE AND TIME OF LATEST TRANSACTION
- control field: 20250101094811.0
008 - FIXED-LENGTH DATA ELEMENTS
- fixed length control field: 250101|| aca||aabn | a|a d
040 ## - CATALOGING SOURCE
- Original cataloging agency: NUST
- Transcribing agency: NUST
150 ## - HEADING--TOPICAL TERM
- Topical term or geographic name entry element: Failure mechanism in semiconductor devices
670 ## - SOURCE DATA FOUND
- Source citation: Work cat.: (NUST): E. Ajith Amerasekera 127306, Failure mechanism in semiconductor devices, 1997.