Pattern classification / Richard O. Duda, Peter E. Hart, David G. Stork.

By: Duda, Richard OContributor(s): Hart, Peter E, 1941- | Stork, David GPublisher: New York : Wiley, c2001Edition: 2nd edDescription: xx, 654 p. : ill. ; 27 cmSubject(s): Pattern recognition systems | Statistical decisionDDC classification: 006.4,DUD Online resources: Contributor biographical information | Publisher description | Table of Contents
Contents:
Introduction (Pag1), Bayesian Decision Theory (Page-20), Maximum-likelihood and Bayesian parameter estimation (Page-84), Non parametric Techniques (Page-161), Linear Discriminant Function (Page-215), Multi layer Neural Networks (Page-282), Stochastic Methods (Page- 350), Non metric Methods (Page-394), Algorithms - Independent Machine Learning (Page-453),Unsupervised Learning and Clustering (Page-517).
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Reference Reference Military College of Signals (MCS)
Military College of Signals (MCS)
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Book Book Military College of Signals (MCS)
Military College of Signals (MCS)
General Stacks 006.4,DUD (Browse shelf) Link to resource Available Almirah No.7, Shelf No.4 MCS36867
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Introduction (Pag1), Bayesian Decision Theory (Page-20), Maximum-likelihood and Bayesian parameter estimation (Page-84), Non parametric Techniques (Page-161), Linear Discriminant Function (Page-215), Multi layer Neural Networks (Page-282), Stochastic Methods (Page- 350), Non metric Methods (Page-394), Algorithms - Independent Machine Learning (Page-453),Unsupervised Learning and Clustering (Page-517).

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