McGraw-Hill electronic testing handbook : procedures and techniques / John D. Lenk.

By: Lenk, John DPublisher: New York : McGraw-Hill, c1994Description: xvii, 397 p. : ill. ; 24 cmISBN: 0070376026 (H) :Subject(s): Telecommunication EngineeringDDC classification: 621.380287,LEN
Contents:
Electronic Meters (Page-1), Oscilloscope (Page-75), Generators (Page-139), Electronic Counters And Frequency Standards (Page-181), Probes And Transducers (Page-191), Special Purpose Test Equipment (Page-203), Two-Junction (Page-219), Field Effect Transistors (Page-235), Unijunction And Programmable UJT Tests (Page-261), Solid State Diode Tests (Page-279), Thyristor And Control Rectifier Tests (Page-295), Audio And Op-Amp Tests (Page-317), Power Supply Tests (Page-339), Radio Frequency Tests (Page-351), Communications Equipment Tests (Page-369).
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Item type Current location Home library Shelving location Call number URL Status Notes Date due Barcode Item holds
Reference Reference Military College of Signals (MCS)
Military College of Signals (MCS)
Reference 621.380287,LEN (Browse shelf) Link to resource Not for loan Almirah No.20, Shelf No.6 MCS1979
Total holds: 0

Electronic Meters (Page-1), Oscilloscope (Page-75), Generators (Page-139), Electronic Counters And Frequency Standards (Page-181), Probes And Transducers (Page-191), Special Purpose Test Equipment (Page-203), Two-Junction (Page-219), Field Effect Transistors (Page-235), Unijunction And Programmable UJT Tests (Page-261), Solid State Diode Tests (Page-279), Thyristor And Control Rectifier Tests (Page-295), Audio And Op-Amp Tests (Page-317), Power Supply Tests (Page-339), Radio Frequency Tests (Page-351), Communications Equipment Tests (Page-369).

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