Electromigration and electronic device degradation / edited by Aris Christou.
Publisher: New York : Wiley, c1994Description: xiv, 343 p. : ill. ; 25 cmISBN: 0471584894 (cloth : alk. paper)Subject(s): Telecommunication EngineeringDDC classification: 621.3815,ELE Online resources: Publisher description | Table of Contents| Item type | Current location | Home library | Shelving location | Call number | URL | Status | Notes | Date due | Barcode | Item holds |
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Book
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Military College of Signals (MCS) | Military College of Signals (MCS) | General Stacks | 621.3815,ELE (Browse shelf) | Link to resource | Available | Almirah No.32, Shelf No.6 | MCS26470 |
Reliability and Electromigration Degradation of GaAs Microwave Monolithic Integrated Circuits (Page-1), Simulation and Computer Models for Electromigration (Page-27), Temperature Dependencies on Electromigration (Page-79), Electromigration and Related Failure Mechanisms in VLSI Metallizations (Page-105),Metallic Electromigration Phenomena (Page-139), Theoretical and Experimental Study of Electromigration (Page-167), GaAs on Silicon Performance and Reliability (Page-235),Electromigration and Stability of Multilayer Metal-Semiconductor Systems on GaAs (Page-263), Electrothermomigration Theory and Experiments in Aluminum Thin Film Metallizations (Page-291), Reliable Metallization for VLSI (Page-317).
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