Applied electronic instrumentation and measurement / David Buchla, Wayne McLachlan.
Publisher: New York : Toronto : New York : Merrill ; Collier Macmillan Canada ; Maxwell Macmillan International Pub. Group, c1992Description: xviii, 830 p : ill. ; 24 cmISBN: 067521162XSubject(s): Telecommunication EngineeringDDC classification: 621.38154,BUC| Item type | Current location | Home library | Shelving location | Call number | URL | Status | Notes | Date due | Barcode | Item holds |
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Book
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Military College of Signals (MCS) | Military College of Signals (MCS) | General Stacks | 621.38154,BUC (Browse shelf) | Link to resource | Available | Almirah No.34, Shelf No.5 | MCS28196 |
Measurement Principles (Page-3), Data and Data Analysis (Page-35), Standards and Calibration of Instruments (Page-70), Diode and Transistor Circuits (Page-103), Operational Amplifiers (Page-163), Digital Circuits (Page-219), Meters and Bridges (Page-281), Oscilloscopes (Page-333), Signal Sources (Page-395), Signal-Analysis Instruments (Page-426), Digital Analysis Instruments (Page-463), Noise and Noise Reduction Techniques (Page-493), Transducers (Page-545), Data Acquisition, Recording and Control (Page-596), Automatic Test Equipment (Page-624), Video Test Methods (Page-685), Biomedical Instruments (Page-742).
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