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Dielectric Characterization of Rare-Earth Based Ceramics, High-k Materials: Future of Microelectronics / Allah Bakhsh.

By: Allah BakhshContributor(s): Dr. Asghari Maqsood Material type: Text

TextPublisher: Islamabad : SCME - NUST, 2012Description: 30cmSubject(s): Materials and Surface Engineering MS-ThesisDDC classification: 620.44

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Item type	Current location	Home library	Shelving location	Call number	Status	Date due	Barcode	Item holds
Thesis	Central Library (CL)	Central Library (CL)	Thesis	620.44 (Browse shelf)	Available		CL-T-5342
Thesis	Central Library (CL)	Central Library (CL)	Thesis	620.44 (Browse shelf)	Available		CL-T-5021

Total holds: 0

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Previous	620.44 Optimized Synthesis and Characterization of TiO2 Nanotubes via Electrochemical Anodization Method for Application in DSSCs /	620.44 Performance Simulation of Vulcanized Natural Rubber based Auxetic Cellular Structures /	620.44 Investigation on the Effect of Nanoclay on Mechanical and Thermal Properties of Epoxy/Nanoclay Composite /	620.44 Dielectric Characterization of Rare-Earth Based Ceramics, High-k Materials: Future of Microelectronics /	620.44 Effect Of Various Shapes and Sizes of Micro and Nano Fillers on the Physical and Mechanical Properties of Transfer Molded Polyamide 6 /	620.44 Synthesis and Characterization of Anodic Titanium Oxide Nano-structure for Use in Dye Sensitized Solar Cells /	620.44 High Temperature Oxidation of Laser Treated Air Plasma Sprayed Ni-20Cr Coating /	Next

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