NUST Institutions Library Catalogue

Designing Acceptance Test Procedures (ATPs) for Smart Nano Grid Applications / Kiran Majeed Choudhry

By: Majeed, Kiran ChoudhryContributor(s): Dr. Shoaib Ahmed KhanMaterial type: TextTextPublisher: Islamabad : CEME - NUST, 2015Description: 187 p. : ill. : 30cmSubject(s): Software Engineering-MS-ThesisDDC classification: 620.1
Tags from this library: No tags from this library for this title. Log in to add tags.
Item type Current location Home library Shelving location Call number Status Date due Barcode Item holds
Thesis Thesis Central Library (CL)
Central Library (CL)
Thesis 620.1 (Browse shelf) Available CL-T-540
Total holds: 0

There are no comments on this title.

to post a comment.
© 2023 Central Library, National University of Sciences and Technology. All Rights Reserved.