Principles of measurement systems / John P. Bentley.
Material type:
TextPublisher: Harlow [England] : New York, NY : Longman Scientific & Technical ; Wiley, 1995Edition: 3rd edDescription: xi, 468 p. : ill. ; 25 cmISBN: 0470234458; 0582237793 (England)Subject(s): Automatic control | Engineering instruments | MCE | Physical instruments | Physical measurementsDDC classification: 530.8
| Item type | Current location | Home library | Call number | URL | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|
Book
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Military College of Engineering (MCE) | Military College of Engineering (MCE) | 530.8 BEN (Browse shelf) | Link to resource | Available | MCE-28801 |
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| 530.412 GOD Properties of matter | 530.412 wag Properties of matter | 530.412 wag Properties of matter | 530.8 BEN Principles of measurement systems / | 530.912 TEM Properties of matter | 5300.02462 WEB College technical physics | 531/.32 NEW An introduction to random vibrations, spectral and wavelet analysis / |
Includes index.
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