Thin film materials , stress, defect formation and surface evolution
Material type:
TextPublisher: USA CAMBRIDGE UNIVERSITY PRESS 2003Description: XVIII, 802PISBN: 0521822815Subject(s): THIN FILM MATERIALSDDC classification: 621.38152 FRE
| Item type | Current location | Home library | Shelving location | Call number | Status | Date due | Barcode | Item holds |
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Book
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College of Electrical & Mechanical Engineering (CEME) | College of Electrical & Mechanical Engineering (CEME) | General Stacks | 621.38152 FRE (Browse shelf) | Available | CEME-45712 | ||
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Book
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College of Electrical & Mechanical Engineering (CEME) | College of Electrical & Mechanical Engineering (CEME) | General Stacks | 621.38152 FRE (Browse shelf) | Available | CEME-45711 |
Total holds: 0
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| 621.38152 FER Semiconductors | 621.38152 FJE Introduction to device modeling and circuit simulation | 621.38152 FRA'P THE PHSICS OF SEMICONDUCTOR DEVICES | 621.38152 FRE Thin film materials , stress, defect formation and surface evolution | 621.38152 FRE Thin film materials , stress, defect formation and surface evolution | 621.38152 GAL Gallium arsenide materials devices and circuits | 621.38152 GIB'S SEMICONDUCTOR ELECTRONICS |
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