RELIABILITY BY DESIGN, CAE TECHNIQUES FOR ELECTRONIC COMPONENTS AND SYSTEMS
Material type:
TextPublisher: NEWYORK JOHN WILEY 1992Description: 275PISBN: 0-471-93193-4DDC classification: 621.3815 BRO'R
| Item type | Current location | Home library | Shelving location | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|
Book
|
College of Electrical & Mechanical Engineering (CEME) | College of Electrical & Mechanical Engineering (CEME) | General Stacks | 621.3815 BRO'R (Browse shelf) | Available | CEME-27593 |
Total holds: 0
Browsing College of Electrical & Mechanical Engineering (CEME) shelves, Shelving location: General Stacks Close shelf browser
| 621.3815 BOY Electronic Devices and Circuit Theory | 621.3815 BOY Electronic Devices and Circuit Theory | 621.3815 BOY'E Electronic devices and circuit theory laboratory manual | 621.3815 BRO'R RELIABILITY BY DESIGN, CAE TECHNIQUES FOR ELECTRONIC COMPONENTS AND SYSTEMS | 621.3815 BUR An Introduction to Mixed-Signal IC Test and measurement | 621.3815 CAR Linear IC applications :a designer's handbook a designer's handbook | 621.3815 CAR Linear IC applications :a designer's handbook a designer's handbook |

Book
There are no comments on this title.