Atomic force microscopy-based nanorobotics: modelling, simulation, setup building and experiments
Material type:
TextPublisher: USA Springer 2011Description: xiv,342 PISBN: 9783642203282Subject(s): Modelling,Simulation,Setup Building ExperimentsDDC classification: 629.892 XIE
| Item type | Current location | Home library | Collection | Shelving location | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|---|
Book
|
College of Electrical & Mechanical Engineering (CEME) | College of Electrical & Mechanical Engineering (CEME) | NFIC | General Stacks | 629.892 XIE (Browse shelf) | Available | SCB-50028 | ||
Book
|
College of Electrical & Mechanical Engineering (CEME) | College of Electrical & Mechanical Engineering (CEME) | NFIC | General Stacks | 629.892 XIE (Browse shelf) | Available | CEME-50028 |
Total holds: 0

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