NUST Institutions Library Catalogue catalog › Details for: Principles of semiconductor network testing

Normal view MARC view ISBD view

Principles of semiconductor network testing Amir Afshar

By: Afshar, Amir Material type: Text

TextPublisher: c.1995ISBN: 0750694726Subject(s): Semiconductors--Testing -- ELDDC classification: 621.381548 AFS

Tags from this library: No tags from this library for this title. Log in to add tags.

Item type	Current location	Home library	Call number	Status	Date due	Barcode	Item holds
Book	Pakistan Navy Engineering College (PNEC)	Pakistan Navy Engineering College (PNEC)	621.381548 AFS (Browse shelf)	Available		PNECLIB-024714

Total holds: 0

Previous			No cover image available					Next
Previous	621.38154 HEL Modern electronic instrumentation and measurement techniques	621.38154 MUR Transducers and instrumentation	621.38154 TUR Bridges and other null devices,	621.381548 AFS Principles of semiconductor network testing	621.381548 BEL Electronic instrumentation and measurements	621.381548 BRI Newnes electronic testing and inspection pocket book	621.381548 DAV Pocket digital multimeter techniques	Next

There are no comments on this title.

to post a comment.