NUST Institutions Library Catalogue

Advanced production testing of RF, SoC, and SiP devices Joe Kelly, Michael Engelhardt

By: Kelly, JoeContributor(s): Engelhardt, MichaelSeries: Artech House microwave libraryPublisher: Boston : Artech House, c2007Description: xx, 301 p. : ill. ; 24 cmISBN: 158053709X; 9781580537094Subject(s): Systems on a chip -- TestingDDC classification: 621.3815
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Item type Current location Home library Collection Shelving location Call number Status Date due Barcode Item holds
Book Book Central Library (CL)
Central Library (CL)
NFIC General Stacks 621.3815 KEL (Browse shelf) Available SEECS008622
Total holds: 0

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