TY  - GEN
AU  - Duda,Richard O.
AU  - Hart,Peter E.
AU  - Stork,David G.
TI  - Pattern classification
U1  - 006.4,DUD 
PY  - 2001///
CY  - New York
PB  - Wiley
KW  - Pattern recognition systems
KW  - Statistical decision
N1  - Introduction (Pag1), Bayesian Decision Theory (Page-20), Maximum-likelihood and Bayesian parameter estimation (Page-84), Non parametric Techniques (Page-161), Linear Discriminant Function (Page-215), Multi layer Neural Networks (Page-282), Stochastic Methods (Page- 350), Non metric Methods (Page-394), Algorithms - Independent Machine Learning (Page-453),Unsupervised Learning and Clustering (Page-517)
UR  - http://www.loc.gov/catdir/bios/wiley041/99029981.html
UR  - http://www.loc.gov/catdir/description/wiley032/99029981.html
UR  - http://www.loc.gov/catdir/toc/onix03/99029981.html
ER  -