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  <titleInfo>
    <title>Microwave measurement</title>
  </titleInfo>
  <name type="personal">
    <namePart>Bailey, A. E.</namePart>
  </name>
  <name type="corporate">
    <namePart>Institution of Electrical Engineers</namePart>
  </name>
  <typeOfResource/>
  <originInfo>
    <place>
      <placeTerm type="text">London, UK</placeTerm>
    </place>
    <publisher>P. Peregrinus on behalf of the Institution of Electrical Engineers</publisher>
    <dateIssued>c1985</dateIssued>
    <issuance/>
  </originInfo>
  <physicalDescription>
    <extent>xi, 460 p. : ill. ; 24 cm.</extent>
  </physicalDescription>
  <tableOfContents>Transmission Lines (Page-1), Scattering Coefficients (Page-17), Circuits analysis (Page-48), Modern Lines (Page-60), Reflection and Matching (Page-71), Detector and Detection for measurement (Page-91), Power Measurement (Page-102), Attenuation Measurement (Page-129), Microwave Network analysis  (Page-170), Noise Measurement (Page-195), Sampling Principle (Page-223), Sampling System (Page-239),Spectrum Analysis (Page-264), Swept and Stepped Frequency (Page-284), Analog system (Page-300), Digital System  (Page-324), Measurement on Active device (Page-362), Antenna Measurement (Page-375), Power Flux Density Measurement (Page-388), Automation in microwave (Page-402), Uncertainty and Confidence in measurement (Page-418), Who Makes Measurement And Why?  (Page-418),</tableOfContents>
  <note type="statement of responsibility">edited by A.E. Bailey.</note>
  <subject authority="lcsh">
    <topic>Telecommunication Engineering</topic>
  </subject>
  <classification authority="ddc">621.3813,MIC</classification>
  <relatedItem type="series">
    <titleInfo>
      <title>IEE electrical measurement series ; 3</title>
    </titleInfo>
  </relatedItem>
  <identifier type="isbn">0863410480</identifier>
  <identifier type="lccn">86124401</identifier>
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    <recordChangeDate encoding="iso8601">20220812123933.0</recordChangeDate>
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