Lenk, John D. <br/><br/>
McGraw-Hill electronic testing handbook :  procedures and techniques / 
John D. Lenk. 
 - New York :  McGraw-Hill,  c1994. 
 - xvii, 397 p. :  ill. ;  24 cm. 
<br/><br/>Electronic Meters (Page-1), Oscilloscope (Page-75), Generators (Page-139), Electronic Counters And Frequency Standards (Page-181), Probes And Transducers (Page-191), Special Purpose Test Equipment (Page-203), Two-Junction (Page-219), Field Effect Transistors (Page-235), Unijunction And Programmable UJT Tests (Page-261), Solid State Diode Tests (Page-279), Thyristor And Control Rectifier Tests (Page-295), Audio And Op-Amp Tests (Page-317), Power Supply Tests (Page-339), Radio Frequency Tests (Page-351), Communications Equipment Tests (Page-369). 
<br/><br/><label>ISBN: </label>0070376026 (H) : 
<br/><br/><label>LCCN: </label>93019595 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Telecommunication Engineering.
<br/><br/><label>Dewey Class. No.: </label>621.380287,LEN