01072    a2200181   4500003000500000005001700005010001600022020002100038040000900059082001900068100001800087245009000105260003700195300003500232505055500267650003500822740003300857Nust20220803170653.0  a   93019595  a0070376026 (H) :  cNust00a621.380287,LEN1 aLenk, John D.10aMcGraw-Hill electronic testing handbook :bprocedures and techniques /cJohn D. Lenk.  aNew York :bMcGraw-Hill,cc1994.  axvii, 397 p. :bill. ;c24 cm.  aElectronic Meters (Page-1), Oscilloscope (Page-75), Generators (Page-139), Electronic Counters And Frequency Standards (Page-181), Probes And Transducers (Page-191), Special Purpose Test Equipment (Page-203), Two-Junction (Page-219), Field Effect Transistors (Page-235), Unijunction And Programmable UJT Tests (Page-261), Solid State Diode Tests (Page-279), Thyristor And Control Rectifier Tests (Page-295), Audio And Op-Amp Tests (Page-317), Power Supply Tests (Page-339), Radio Frequency Tests (Page-351), Communications Equipment Tests (Page-369). 0aTelecommunication Engineering.0 aElectronic testing handbook.