<?xml version="1.0" encoding="UTF-8"?>
<record
    xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance"
    xsi:schemaLocation="http://www.loc.gov/MARC21/slim http://www.loc.gov/standards/marcxml/schema/MARC21slim.xsd"
    xmlns="http://www.loc.gov/MARC21/slim">

  <leader>01135    a2200205   4500</leader>
  <controlfield tag="003">Nust</controlfield>
  <controlfield tag="005">20220803170653.0</controlfield>
  <datafield tag="010" ind1=" " ind2=" ">
    <subfield code="a">   93019595</subfield>
  </datafield>
  <datafield tag="020" ind1=" " ind2=" ">
    <subfield code="a">0070376026 (H) :</subfield>
  </datafield>
  <datafield tag="040" ind1=" " ind2=" ">
    <subfield code="c">Nust</subfield>
  </datafield>
  <datafield tag="082" ind1="0" ind2="0">
    <subfield code="a">621.380287,LEN</subfield>
  </datafield>
  <datafield tag="100" ind1="1" ind2=" ">
    <subfield code="a">Lenk, John D.</subfield>
    <subfield code="9">57741</subfield>
  </datafield>
  <datafield tag="245" ind1="1" ind2="0">
    <subfield code="a">McGraw-Hill electronic testing handbook :</subfield>
    <subfield code="b">procedures and techniques /</subfield>
    <subfield code="c">John D. Lenk.</subfield>
  </datafield>
  <datafield tag="260" ind1=" " ind2=" ">
    <subfield code="a">New York :</subfield>
    <subfield code="b">McGraw-Hill,</subfield>
    <subfield code="c">c1994.</subfield>
  </datafield>
  <datafield tag="300" ind1=" " ind2=" ">
    <subfield code="a">xvii, 397 p. :</subfield>
    <subfield code="b">ill. ;</subfield>
    <subfield code="c">24 cm.</subfield>
  </datafield>
  <datafield tag="505" ind1=" " ind2=" ">
    <subfield code="a">Electronic Meters (Page-1), Oscilloscope (Page-75), Generators (Page-139), Electronic Counters And Frequency Standards (Page-181), Probes And Transducers (Page-191), Special Purpose Test Equipment (Page-203), Two-Junction (Page-219), Field Effect Transistors (Page-235), Unijunction And Programmable UJT Tests (Page-261), Solid State Diode Tests (Page-279), Thyristor And Control Rectifier Tests (Page-295), Audio And Op-Amp Tests (Page-317), Power Supply Tests (Page-339), Radio Frequency Tests (Page-351), Communications Equipment Tests (Page-369).</subfield>
  </datafield>
  <datafield tag="650" ind1=" " ind2="0">
    <subfield code="a">Telecommunication Engineering.</subfield>
  </datafield>
  <datafield tag="740" ind1="0" ind2=" ">
    <subfield code="a">Electronic testing handbook.</subfield>
  </datafield>
  <datafield tag="942" ind1=" " ind2=" ">
    <subfield code="c">REF</subfield>
    <subfield code="2">ddc</subfield>
  </datafield>
  <datafield tag="999" ind1=" " ind2=" ">
    <subfield code="c">175656</subfield>
    <subfield code="d">175656</subfield>
  </datafield>
  <datafield tag="952" ind1=" " ind2=" ">
    <subfield code="0">0</subfield>
    <subfield code="1">0</subfield>
    <subfield code="2">ddc</subfield>
    <subfield code="4">0</subfield>
    <subfield code="7">0</subfield>
    <subfield code="a">MCS</subfield>
    <subfield code="b">MCS</subfield>
    <subfield code="c">REF</subfield>
    <subfield code="d">2016-12-12</subfield>
    <subfield code="o">621.380287,LEN</subfield>
    <subfield code="p">MCS1979</subfield>
    <subfield code="r">2016-12-08</subfield>
    <subfield code="w">2016-12-12</subfield>
    <subfield code="y">REF</subfield>
    <subfield code="z">Almirah No.20, Shelf No.6</subfield>
  </datafield>
</record>
