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  <titleInfo>
    <title>McGraw-Hill electronic testing handbook</title>
    <subTitle>procedures and techniques</subTitle>
  </titleInfo>
  <titleInfo type="alternative">
    <title>Electronic testing handbook</title>
  </titleInfo>
  <name type="personal">
    <namePart>Lenk, John D.</namePart>
    <role>
      <roleTerm authority="marcrelator" type="text">creator</roleTerm>
    </role>
  </name>
  <typeOfResource/>
  <originInfo>
    <place>
      <placeTerm type="text">New York</placeTerm>
    </place>
    <publisher>McGraw-Hill</publisher>
    <dateIssued>c1994</dateIssued>
    <issuance/>
  </originInfo>
  <physicalDescription>
    <extent>xvii, 397 p. : ill. ; 24 cm.</extent>
  </physicalDescription>
  <tableOfContents>Electronic Meters (Page-1), Oscilloscope (Page-75), Generators (Page-139), Electronic Counters And Frequency Standards (Page-181), Probes And Transducers (Page-191), Special Purpose Test Equipment (Page-203), Two-Junction (Page-219), Field Effect Transistors (Page-235), Unijunction And Programmable UJT Tests (Page-261), Solid State Diode Tests (Page-279), Thyristor And Control Rectifier Tests (Page-295), Audio And Op-Amp Tests (Page-317), Power Supply Tests (Page-339), Radio Frequency Tests (Page-351), Communications Equipment Tests (Page-369).</tableOfContents>
  <note type="statement of responsibility">John D. Lenk.</note>
  <subject authority="lcsh">
    <topic>Telecommunication Engineering</topic>
  </subject>
  <classification authority="ddc">621.380287,LEN</classification>
  <identifier type="isbn">0070376026 (H) :</identifier>
  <identifier type="lccn">93019595</identifier>
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    <recordChangeDate encoding="iso8601">20220803170653.0</recordChangeDate>
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