Hartnagel, Hans, <br/><br/>
Microwave noise in semiconductor devices / 
Hans Ludwig Hartnagel, Ramunas Katilius, Arvydas Matulionis. 
 - New York :  Wiley,  c2001. 
 - xviii, 293 p. :  ill. ;  25 cm. 
<br/><br/>Introduction (Page-1), Kinetic Theory of Nonequilibrium Processes (Page-16), Fluctuations: Kinetic Theory (Page-25), Effect of Interelectron Collisions on Fluctuation Phenomena (Page-37), Boltzmann-Langevin Equation (Page-44), Fluctuations and Diffusion (Page-50), Features of Hot-Electron Fluctuation Spectra (Page-62), Experimental Techniques (Page-81), Hot-Electron Microwave Noise in Elementary Semiconductors (Page-96), Hot-Electron Microwave Noise in GaAs and InP (Page-116), Length-Dependent Hot-Electron Noise (Page-128), Hot-Electron Noise in Doped Semiconductors: Theory (Page-147), Electronic Noise in Standard-Doped n-Type GaAs (Page-161), Electron Diffusion in Standard-Doped n-Type GaAs (Page-175), Electronic Subbands in Quantum Wells (Page-181Hot-Electron Noise in ALGaAs/GaAs 2DEG Channels (Page-197), Hot-Electron Noise in InP-Based 2DEG Channels (Page-209),  Cutoff Frequencies of Fast and Ultrafast Processes (Page-220), Spatially Inhomogeneous Fluctuations (Page-230), Monte Carlo Approach to Microwave Noise in Devices (Page-245),     
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<br/><br/><label>ISBN: </label>0471384321 (cloth : alk. paper) 
<br/><br/><label>LCCN: </label>00043688 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductors.<br/>Telecommunication Engineering.
<br/><br/><label>Dewey Class. No.: </label>621.38133,HAR