02065 a2200277 4500 Nust 20220812111120.0 00043688 0471384321 (cloth : alk. paper) Nust 621.38133,HAR Hartnagel, Hans, 96959 Microwave noise in semiconductor devices / Hans Ludwig Hartnagel, Ramunas Katilius, Arvydas Matulionis. New York : Wiley, c2001. xviii, 293 p. : ill. ; 25 cm. Introduction (Page-1), Kinetic Theory of Nonequilibrium Processes (Page-16), Fluctuations: Kinetic Theory (Page-25), Effect of Interelectron Collisions on Fluctuation Phenomena (Page-37), Boltzmann-Langevin Equation (Page-44), Fluctuations and Diffusion (Page-50), Features of Hot-Electron Fluctuation Spectra (Page-62), Experimental Techniques (Page-81), Hot-Electron Microwave Noise in Elementary Semiconductors (Page-96), Hot-Electron Microwave Noise in GaAs and InP (Page-116), Length-Dependent Hot-Electron Noise (Page-128), Hot-Electron Noise in Doped Semiconductors: Theory (Page-147), Electronic Noise in Standard-Doped n-Type GaAs (Page-161), Electron Diffusion in Standard-Doped n-Type GaAs (Page-175), Electronic Subbands in Quantum Wells (Page-181Hot-Electron Noise in ALGaAs/GaAs 2DEG Channels (Page-197), Hot-Electron Noise in InP-Based 2DEG Channels (Page-209), Cutoff Frequencies of Fast and Ultrafast Processes (Page-220), Spatially Inhomogeneous Fluctuations (Page-230), Monte Carlo Approach to Microwave Noise in Devices (Page-245), Semiconductors. 11016 Telecommunication Engineering. Katilius, Ramunas. 96960 Matulionis, A. 1946- 96961 Contributor biographical information http://www.loc.gov/catdir/bios/wiley042/00043688.html Publisher description http://www.loc.gov/catdir/description/wiley034/00043688.html Table of Contents http://www.loc.gov/catdir/toc/onix06/00043688.html REF ddc 175659 175659 0 0 ddc 0 0 MCS MCS REF 2016-12-12 621.38133,HAR MCS30725 2016-12-08 2016-12-12 REF Almirah No.21, Shelf No.3