Integrated circuit manufacturability :  the art of process and design integration / 
edited by Jos⥠Pineda de Gyvez, Dhiraj Pradhan. 
 - Piscataway, NJ :  New York :  IEEE Press ;  Institute of Electrical and Electronics Engineers,  c1999. 
 - xv, 316 p. :  ill. ;  26 cm. 
<br/><br/>Introduction (Page-1), Defect Monitoring And Characterization (Page-9), Digital CMOS Fault Modeling And Inductive Fault Analysis (Page-43), Functional Yield Modeling (Page-85), Critical Area And Fault Probability Prediction (Page-121), Statistical Methods Of Parametric Yield And Quality Enhancement (Page-157), Architectural Fault Tolerance (Page-217), Design For Test And Manufacturability (Page-269), Testing Solutions For MCM Manufacturing (Page-287). 
<br/><br/><label>ISBN: </label>8186308733 
<br/><br/><label>LCCN: </label>98006335 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Integrated circuits--Testing.<br/>Metal oxide semiconductors, Complementary--Computer-aided design.<br/>Telecommunication engineering
<br/><br/><label>Dewey Class. No.: </label>621.3815,INT