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  <titleInfo>
    <title>Principles of measurement systems</title>
  </titleInfo>
  <name type="personal">
    <namePart>Bentley, John P.</namePart>
    <role>
      <roleTerm authority="marcrelator" type="text">creator</roleTerm>
    </role>
  </name>
  <typeOfResource/>
  <originInfo>
    <place>
      <placeTerm type="text">New York</placeTerm>
    </place>
    <publisher>Pearson Prentice Hall</publisher>
    <dateIssued>2000</dateIssued>
    <edition>3rd ed.</edition>
    <issuance/>
  </originInfo>
  <physicalDescription>
    <extent>468p.:</extent>
  </physicalDescription>
  <tableOfContents>The General Measurement Systems (Page-3), Typical Measurement Sys Elements (Page-135), Specialized Measurement Systems (Page-275), Optical Measurement Sys (Page-343), Ultrasonic Measurement Systems (Page-384), Gas Chromatography (Page-417), Data Acquisition And Comm. Systems (Page-431).</tableOfContents>
  <note type="statement of responsibility">John P. Bentley.</note>
  <subject authority="lcsh">
    <topic>Automatic control</topic>
  </subject>
  <subject authority="lcsh">
    <topic>Engineering instruments</topic>
  </subject>
  <subject authority="lcsh">
    <topic>Physical instruments</topic>
  </subject>
  <subject authority="lcsh">
    <topic>Physical measurements</topic>
  </subject>
  <classification authority="ddc">530.8,BEN</classification>
  <identifier type="isbn">9814053848</identifier>
  <identifier type="lccn">2004044467</identifier>
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