01303 a2200241 4500 Nust 20221125143035.0 87023013 0471624632 Nust 621.3815,BAR Bardell, Paul H. 103629 Built-in test for VLSI : pseudorandom techniques / Paul H. Bardell, William H. McAnney, Jacob Savir. New York : Wiley, c1987. xiii, 354 p. : ill. ; 24 cm. Digital Testing and the Need for Testable (Page-1), Introduction to Testable Design (Page-17), Pseudorandom Sequence Generators (Page-61), Test Response Compression Techniques (Page-89), Shift Register Polynomial Division (Page-109), Special Purpose Shift Register Circuits (Page-145), Random Pattern Built-in Test (Page-177), Built –in Test Structures (Page-279), Limitations and other Concerns of Random Pattern Testing (Page-314), Test System Requirements for Built-In Test (Page-311). Telecommunication engineering McAnney, William H. 103630 Savir, Jacob. 103631 Publisher description http://www.loc.gov/catdir/description/wiley033/87023013.html Table of Contents http://www.loc.gov/catdir/toc/onix04/87023013.html ddc BK 182015 182015 0 0 ddc 0 0 MCS MCS GEN 2016-12-12 621.3815,BAR MCS1047 2016-12-08 2016-12-12 BK Almirah No.32, Shelf No.5