TY  - GEN
AU  - Bardell,Paul H.
AU  - McAnney,William H.
AU  - Savir,Jacob
TI  - Built-in test for VLSI: pseudorandom techniques 
SN  - 0471624632
U1  - 621.3815,BAR 
PY  - 1987///
CY  - New York
PB  - Wiley
KW  - Telecommunication engineering
N1  - Digital Testing and the Need for Testable (Page-1), Introduction to Testable Design (Page-17), Pseudorandom Sequence Generators (Page-61), Test Response Compression Techniques (Page-89), Shift Register Polynomial Division (Page-109), Special Purpose Shift Register Circuits (Page-145), Random Pattern Built-in Test (Page-177), Built –in Test Structures (Page-279), Limitations and other Concerns of Random Pattern Testing (Page-314), Test System Requirements for Built-In Test (Page-311)
UR  - http://www.loc.gov/catdir/description/wiley033/87023013.html
UR  - http://www.loc.gov/catdir/toc/onix04/87023013.html
ER  -