Becker, Peter W. <br/><br/>
Design of systems and circuits for maximum reliability or maximum production yield / 
Peter W. Becker, Finn Jensen. 
 - New York :  McGraw-Hill,  c1977. 
 - xiv, 293 p. :  ill. ;  24 cm. 
<br/><br/>Introduction (Page-1), Some Basic Reliability Concepts (Page-5), Mathematical Design (Page-69), A Mathematical Model of Yield of Drift Reliability (Page-83), Methods for Computing the Probability of System or Circuit Success (Page-103), Basic for the Prediction of Yield and Drift Reliability (Page-152), Examples of Output-Variable Probability Densities Obtained by Convolution and Monte Carlo Techniques (Page-163), Optimization Techniques (Page-176), Circuit Examples Illustrating the use of the Proposed Design Strategies (Page-193). 
<br/><br/><label>ISBN: </label>0070042306 : 
<br/><br/><label>LCCN: </label>76017013 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electronic circuit design--Data processing.<br/>Electronic systems--Design and construction--Data processing.<br/>Telecommunication engineering
<br/><br/><label>Dewey Class. No.: </label>621.3815,BEC