01214    a2200205   4500003000500000005001700005010001600022020001700038040000900055082001700064100002100081245012000102260003700222300003400259505054200293650004800835650006600883650003400949700002500983Nust20221125143657.0  a   76017013  a0070042306 :  cNust00a621.3815,BEC1 aBecker, Peter W.10aDesign of systems and circuits for maximum reliability or maximum production yield /cPeter W. Becker, Finn Jensen.  aNew York :bMcGraw-Hill,cc1977.  axiv, 293 p. :bill. ;c24 cm.  aIntroduction (Page-1), Some Basic Reliability Concepts (Page-5), Mathematical Design (Page-69), A Mathematical Model of Yield of Drift Reliability (Page-83), Methods for Computing the Probability of System or Circuit Success (Page-103), Basic for the Prediction of Yield and Drift Reliability (Page-152), Examples of Output-Variable Probability Densities Obtained by Convolution and Monte Carlo Techniques (Page-163), Optimization Techniques (Page-176), Circuit Examples Illustrating the use of the Proposed Design Strategies (Page-193). 0aElectronic circuit designxData processing. 0aElectronic systemsxDesign and constructionxData processing. 0aTelecommunication engineering1 aJensen, Finn,d1937-