01300 a2200229 4500 Nust 20221125143657.0 76017013 0070042306 : Nust 621.3815,BEC Becker, Peter W. 103632 Design of systems and circuits for maximum reliability or maximum production yield / Peter W. Becker, Finn Jensen. New York : McGraw-Hill, c1977. xiv, 293 p. : ill. ; 24 cm. Introduction (Page-1), Some Basic Reliability Concepts (Page-5), Mathematical Design (Page-69), A Mathematical Model of Yield of Drift Reliability (Page-83), Methods for Computing the Probability of System or Circuit Success (Page-103), Basic for the Prediction of Yield and Drift Reliability (Page-152), Examples of Output-Variable Probability Densities Obtained by Convolution and Monte Carlo Techniques (Page-163), Optimization Techniques (Page-176), Circuit Examples Illustrating the use of the Proposed Design Strategies (Page-193). Electronic circuit design Data processing. 94835 Electronic systems Design and construction Data processing. 103633 Telecommunication engineering Jensen, Finn, 1937- 103634 ddc BK 182019 182019 0 0 ddc 0 0 MCS MCS GEN 2016-12-12 621.3815,BEC MCS6467 2016-12-08 2016-12-12 BK Almirah No.35, Shelf No.5