Becker, Peter W. creator Jensen, Finn 1937- New York McGraw-Hill c1977 xiv, 293 p. : ill. ; 24 cm. Introduction (Page-1), Some Basic Reliability Concepts (Page-5), Mathematical Design (Page-69), A Mathematical Model of Yield of Drift Reliability (Page-83), Methods for Computing the Probability of System or Circuit Success (Page-103), Basic for the Prediction of Yield and Drift Reliability (Page-152), Examples of Output-Variable Probability Densities Obtained by Convolution and Monte Carlo Techniques (Page-163), Optimization Techniques (Page-176), Circuit Examples Illustrating the use of the Proposed Design Strategies (Page-193). Peter W. Becker, Finn Jensen. Electronic circuit design Data processing Electronic systems Design and construction Data processing Telecommunication engineering 621.3815,BEC 0070042306 : 76017013 20221125143657.0