01168 a2200229 4500 Nust 20221130111430.0 86028174 0471914347 : Nust 621.38152,AME Amerasekera, E. A. 69337 Failure mechanisms in semiconductor devices / E.A. Amerasekera and D.S. Campbell. Chichester [West Sussex] ; New York : Wiley, c1987. xiii, 205 p. : ill. ; 24 cm. Introduction (Page-1), Reliability Theory (Page-5), Failure Mechanisms (Page-12), Failure Mechanisms and Device Technologies (Page-66), Packing (Page-93), Screening (Page-105), Accelerated Testing (Page-116), Physical Failure Analysis Technology (Page-121), Reliability Prediction and Failure Modeling (Page-129), Quality Assurance (Page-135), Conclusions (Page-143). Telecommunication Engineering Campbell, D. S. 103815 Publisher description http://www.loc.gov/catdir/enhancements/fy0607/86028174-d.html Table of contents only http://www.loc.gov/catdir/enhancements/fy0607/86028174-t.html ddc BK 182219 182219 0 0 ddc 0 0 MCS MCS GEN 2016-12-12 621.38152,AME MCS7390 2016-12-08 2016-12-12 BK Almirah No.33, Shelf No.4