Amerasekera, E. A. creator Campbell, D. S. Chichester [West Sussex] New York Wiley c1987 xiii, 205 p. : ill. ; 24 cm. Introduction (Page-1), Reliability Theory (Page-5), Failure Mechanisms (Page-12), Failure Mechanisms and Device Technologies (Page-66), Packing (Page-93), Screening (Page-105), Accelerated Testing (Page-116), Physical Failure Analysis Technology (Page-121), Reliability Prediction and Failure Modeling (Page-129), Quality Assurance (Page-135), Conclusions (Page-143). E.A. Amerasekera and D.S. Campbell. Telecommunication Engineering 621.38152,AME 0471914347 : 86028174 http://www.loc.gov/catdir/enhancements/fy0607/86028174-d.html http://www.loc.gov/catdir/enhancements/fy0607/86028174-t.html http://www.loc.gov/catdir/enhancements/fy0607/86028174-d.html http://www.loc.gov/catdir/enhancements/fy0607/86028174-t.html 20221130111430.0