Taur, Yuan, <br/><br/>
Fundamentals of modern VLSI devices / 
Yuan Taur, Tak H. Ning. 
 - Cambrige, UK ;  New York :  Cambridge University Press,  1998. 
 - xxii, 469 p. :  ill. ;  26 cm. 
<br/><br/>Introduction (Page-1), Basic Device Physics (Page-9), Mosfet Devices (Page-112), CMOS Device Design (Page-164), CMOS Performance Factors (Page-224), Bipolar Devices (Page-292), Bipolar Device Design (Page-351), Bipolar Performance Factors (Page-379). 
<br/><br/><label>ISBN: </label>0521550564 0521559596 (pbk.) 
<br/><br/><label>LCCN: </label>98016162 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Bipolar transistors.<br/>Integrated circuits--Very large scale integration.<br/>Metal oxide semiconductors, Complementary.
<br/><br/><label>Dewey Class. No.: </label>621.395,TAU