B.R Wilkins <br/><br/>
Testing Digital Circuits an Introduction / 
B.R Wilkins 
 - UK  Van Nostrand Reinhold  1986 
 - 196p 
<br/><br/>Testing In Context (Page-1), Test-Pattern Generators (Page-21), Aids To Test Pattern Generators (Page-43), Faults Diagrams (Page-55),  Testing Sequential Logic(Page-76), Testing MSI and LSI Devices (Page-97), Enhancing Testability (Page-122), Designing Of Testability (Page-139), Self-Testing Circuits (Page-158). 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Telecommunication Engineering
<br/><br/><label>Dewey Class. No.: </label>621.38153,WIL