00668    a2200145   4500003000500000005001700005040000900022082001800031100001600049245006000065260003600125300000900161505031800170650003400488Nust20221207190109.0  cNust  a621.38153,WIL  aB.R Wilkins  aTesting Digital Circuits an Introduction /cB.R Wilkins  aUKbVan Nostrand Reinholdc1986  a196p  aTesting In Context (Page-1), Test-Pattern Generators (Page-21), Aids To Test Pattern Generators (Page-43), Faults Diagrams (Page-55),  Testing Sequential Logic(Page-76), Testing MSI and LSI Devices (Page-97), Enhancing Testability (Page-122), Designing Of Testability (Page-139), Self-Testing Circuits (Page-158).  aTelecommunication Engineering