00731 a2200169 4500 Nust 20221207190109.0 Nust 621.38153,WIL B.R Wilkins 104396 Testing Digital Circuits an Introduction / B.R Wilkins UK Van Nostrand Reinhold 1986 196p Testing In Context (Page-1), Test-Pattern Generators (Page-21), Aids To Test Pattern Generators (Page-43), Faults Diagrams (Page-55), Testing Sequential Logic(Page-76), Testing MSI and LSI Devices (Page-97), Enhancing Testability (Page-122), Designing Of Testability (Page-139), Self-Testing Circuits (Page-158). Telecommunication Engineering ddc BK 193549 193549 0 0 ddc 0 0 MCS MCS GEN 2016-12-12 621.38153,WIL MCS5125 2016-12-08 2016-12-12 BK Almirah No.34, Shelf No.3 0 0 ddc 0 0 MCS MCS GEN 2016-12-12 621.38153,WIL MCS5126 2016-12-08 2016-12-12 BK Almirah No.34, Shelf No.3 0 0 ddc 0 0 MCS MCS GEN 2016-12-12 621.38153,WIL MCS5127 2016-12-08 2016-12-12 BK Almirah No.34, Shelf No.3