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  <titleInfo>
    <title>Testing Digital Circuits an Introduction</title>
  </titleInfo>
  <name type="personal">
    <namePart>B.R Wilkins</namePart>
    <role>
      <roleTerm authority="marcrelator" type="text">creator</roleTerm>
    </role>
  </name>
  <typeOfResource/>
  <originInfo>
    <place>
      <placeTerm type="text">UK</placeTerm>
    </place>
    <publisher>Van Nostrand Reinhold</publisher>
    <dateIssued>1986</dateIssued>
    <issuance/>
  </originInfo>
  <physicalDescription>
    <extent>196p</extent>
  </physicalDescription>
  <tableOfContents>Testing In Context (Page-1), Test-Pattern Generators (Page-21), Aids To Test Pattern Generators (Page-43), Faults Diagrams (Page-55),  Testing Sequential Logic(Page-76), Testing MSI and LSI Devices (Page-97), Enhancing Testability (Page-122), Designing Of Testability (Page-139), Self-Testing Circuits (Page-158).</tableOfContents>
  <note type="statement of responsibility">B.R Wilkins</note>
  <subject>
    <topic>Telecommunication Engineering</topic>
  </subject>
  <classification authority="ddc">621.38153,WIL</classification>
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    <recordChangeDate encoding="iso8601">20221207190109.0</recordChangeDate>
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