TY  - BOOK
AU  - Chung, Frank H.
AU  - Chung,Frank H.
AU  - Smith,Deane K.
ED  - NetLibrary, Inc.
TI  - Industrial applications of X-ray diffraction
SN  - 0824719921
AV  - TA417.25 I52 2000eb
U1  - 658.5 21
PY  - 2000///
CY  - New York
PB  - Marcel Dekker
KW  - Radiography, Industrial
KW  - X-rays
KW  - Diffraction
KW  - Electronic books
KW  - local
N1  - Includes bibliographical references and index; Electronic reproduction; Boulder, Colo.; NetLibrary; 2000; Available via World Wide Web; Access may be limited to NetLibrary affiliated libraries
UR  - http://www.columbia.edu/cgi-bin/cul/resolve?clio4240032
ER  -