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  <titleInfo>
    <title>Encyclopedia of materials characterization</title>
    <subTitle>surfaces, interfaces, thin films</subTitle>
  </titleInfo>
  <name type="personal">
    <namePart>C. Richard Brundle</namePart>
    <role>
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  </name>
  <name type="personal">
    <namePart>Brundle, C.R.</namePart>
  </name>
  <name type="personal">
    <namePart>Evans, Charles A.</namePart>
  </name>
  <name type="personal">
    <namePart>Wilson, Shaun.</namePart>
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    <place>
      <placeTerm type="text">Boston</placeTerm>
    </place>
    <place>
      <placeTerm type="text">Greenwich, CT</placeTerm>
    </place>
    <publisher>Butterworth-Heinemann</publisher>
    <publisher>Manning</publisher>
    <dateIssued>c1992</dateIssued>
    <dateIssued encoding="marc">1992</dateIssued>
    <issuance>monographic</issuance>
  </originInfo>
  <language>
    <languageTerm authority="iso639-2b" type="code">eng</languageTerm>
  </language>
  <physicalDescription>
    <form authority="marcform">print</form>
    <extent>xix, 751 p. : ill. ; 25 cm.</extent>
  </physicalDescription>
  <note type="statement of responsibility">editors, C. Richard Brundle, Charles A. Evans, Jr., Shaun Wilson ; managing editor, Lee E. Fitzpatrick.</note>
  <note>Includes bibliographical references and index.</note>
  <subject authority="lcsh">
    <topic>Surfaces (Technology)</topic>
    <topic>Testing</topic>
  </subject>
  <classification authority="lcc">TA418.7 .B73 1992</classification>
  <classification authority="ddc" edition="20">620.44</classification>
  <relatedItem type="series">
    <titleInfo>
      <title>Materials characterization series</title>
    </titleInfo>
  </relatedItem>
  <identifier type="isbn">0750691689</identifier>
  <identifier type="lccn">92014999</identifier>
  <identifier type="uri">http://www.loc.gov/catdir/description/els032/92014999.html</identifier>
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