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  <titleInfo>
    <title>Principles of measurement systems</title>
  </titleInfo>
  <name type="personal">
    <namePart>Bentley, John P.</namePart>
    <role>
      <roleTerm authority="marcrelator" type="text">creator</roleTerm>
    </role>
  </name>
  <typeOfResource>text</typeOfResource>
  <originInfo>
    <place>
      <placeTerm type="text">Burnt Mill, Harlow, Essex, England</placeTerm>
    </place>
    <place>
      <placeTerm type="text">New York</placeTerm>
    </place>
    <publisher>Longman Scientific &amp; Technical</publisher>
    <publisher>Wiley</publisher>
    <dateIssued>1988</dateIssued>
    <edition>2nd ed.</edition>
    <issuance>monographic</issuance>
  </originInfo>
  <physicalDescription>
    <extent>xiv, 503 p. : ill. ; 24 cm.</extent>
  </physicalDescription>
  <note type="statement of responsibility">John P. Bentley.</note>
  <note>Includes index.</note>
  <note>0 0 0 681_200000000000000_BEN</note>
  <subject authority="lcsh">
    <topic>Automatic control</topic>
  </subject>
  <subject authority="lcsh">
    <topic>Engineering instruments</topic>
  </subject>
  <subject authority="lcsh">
    <topic>MCE</topic>
  </subject>
  <subject authority="lcsh">
    <topic>Physical instruments</topic>
  </subject>
  <subject authority="lcsh">
    <topic>Physical measurements</topic>
  </subject>
  <classification authority="ddc">681.2 BEN</classification>
  <identifier type="isbn">0470210567 (Wiley)</identifier>
  <recordInfo/>
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