TY  - BOOK
AU  - Xie, hui
TI  - Atomic force microscopy-based nanorobotics: modelling, simulation, setup building and experiments
SN  - 9783642203282
U1  - 629.892 XIE 
PY  - 2011///
CY  - USA
PB  - Springer
KW  - Modelling,Simulation,Setup Building Experiments
ER  -