TY  - BOOK
AU  - Purviance, J Meehan, M. D
TI  - Yield and reliability in microwave circuit and system design
SN  - 0-89006-527-6
U1  - 621.38152 MEE'Y 
PY  - 1993///
CY  - BOSTON
PB  - ARTECH HOUSE
KW  - COMPLETE AIDED DESIGN ENGINEERING DESIGN STATISTICAL METHOD MICROWAVES INTEGRATED CIRCUIT DESIGN AND CONSTRUCTION STATISTICAL METHOD
ER  -