Afshar, Amir <br/><br/>
Principles of semiconductor network testing 

 - USA  BUTTERWORTH  1995 
 - XIV, 213P 
<br/><br/><label>ISBN: </label>0-7506-9472-6 
<br/><br/><label>Subjects--Topical Terms: </label><br/>INTEGRATING CIRCUIT TESTING SEMICONDUCTORS TESTING
<br/><br/><label>Dewey Class. No.: </label>621.381548 AFS'P