NUST Institutions Library Catalogue Search for '(su:"Integrated circuits") AND (su:"Testing.")'

Genetic algorithms for VLSI design, layout & test automation

By Mazumder, Pinaki.. New Delhi : Pearson Education Inc. , 2003 . xiii, 338 p. : , Includes Index 25 cm.. 8178087073

By Perelroyzen, Evgeni.. Boca Raton, FL : CRC Press, 2007 . 320 p. : 25 cm.. 9780849330575 | 0849330572

Amsterdam ; | Boston : Elsevier Morgan Kaufmann Publishers, 2006 . xxx, 777 p. : 25 cm.. 0123705975

By Rajsuman, Rochit.. Boston, MA : Artech House, 2000 . xiii, 277 p. : 24 cm.. 1580531075

By Burns, Mark,. New York : Oxford University Press, 2001 . xx, 684 p. : 25 cm.. 0195140168

Piscataway, NJ : | New York : IEEE Press ; | Institute of Electrical and Electronics Engineers, 1999 . xv, 316 p. : 26 cm.. 8186308733

By Shepherd, Peter. New York : McGraw-Hill, 1996 . xv, 223 p. : 24 cm.. 0333630394

By Tsui, Frank F.. New York : McGraw-Hill, 1987 . xv, 702 p. : 24 cm.. 0070653410 :

By Bushnell, Michael L.. Boston : Kluwer Academic, 2000 . xviii, 690 s. : 26 cm. 0-7923-7991-8

By Scott, Allan W.. Hoboken, N.J. : IEEE : | Wiley & Sons, 2008 . xx, 503 p. : 25 cm.. 0470129484 (cloth) | 9780470129487 (cloth)

By SAVIR, J, MCANNEY, W. H, BARDELL, PAUL H. NWEWYORK JOHN WILEY 1987 . 354P 0-471-62463-2