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A designer's guide to built-in self-test Charles E. Stroud

by Stroud, Charles E.

Publisher: Boston : Kluwer Academic Publishers, c2002Availability: Items available for loan: Central Library (CL)Call number: 621.381 STR (1).
Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits-(E-BOOK) Michael L. Bushnell, Vishwani D. Agrawal

by Bushnell, Michael L | Agrawal, Vishwani D.

Publisher: Boston : Kluwer Academic, cop. 2000Availability: Items available for loan: Military College of Signals (MCS)Call number: 621.395 BUS (1).
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