NUST Institutions Library Catalogue Search for 'se,phr:"The Morgan Kaufmann series in systems on silicon"'

VLSI test principles and architectures: design for testability design for testability

Amsterdam ; | Boston : Elsevier Morgan Kaufmann Publishers, 2006 . xxx, 777 p. : 25 cm.. 0123705975

By Benini, Luca,. Amsterdam ; | Boston : Elsevier Morgan Kaufmann Publishers, 2006 . x, 395 p. : 25 cm.. 0123705215

By Munden, Richard.. Amsterdam ; | Boston : Elsevier, Morgan Kaufmann Publishers, 2005 . xx, 316 p. : , Includes index. 25 cm.. 0125105819