NUST Institutions Library Catalogue

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Genetic algorithms for VLSI design, layout & test automation Mazumder Pinaki

by Mazumder, Pinaki | Elizabeth M. Rudnick.

Publisher: New Delhi : Pearson Education Inc. , c2003Availability: Items available for loan: Central Library (CL)Call number: 621.395 MAZ (1).
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Digital integrated circuits: design-for-test using Simulink and Stateflow design-for-test using Simulink and Stateflow Evgeni Perelroyzen

by Perelroyzen, Evgeni.

Publisher: Boca Raton, FL : CRC Press, c2007Other title: Design-for-test using Simulink and Stateflow.Online access: Table of contents only | Publisher description Availability: Items available for loan: Central Library (CL)Call number: 621.3815 PER (2).
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VLSI test principles and architectures: design for testability design for testability edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen

by Wang, Laung-Terng | Wu, Cheng-Wen | Wen, Xiaoqing.

Publisher: Amsterdam ; Boston : Elsevier Morgan Kaufmann Publishers, c2006Other title: VLSI test principles and architectures.Availability: Items available for loan: Central Library (CL)Call number: 621.395 WAN (1).
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System-on-a-chip: design and test design and test Rochit Rajsuman

by Rajsuman, Rochit.

Publisher: Boston, MA : Artech House, 2000Availability: Items available for loan: Central Library (CL)Call number: 621.3815 RAJ (1).
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An introduction to mixed-signal IC test and measurement / Mark Burns, Gordon W. Roberts.

by Burns, Mark, 1962- | Roberts, Gordon W, 1959-.

Material type: Text Text; Format: print ; Literary form: Not fiction Publisher: New York : Oxford University Press, c2001Online access: Publisher description | Table of contents only Availability: Items available for loan: Pakistan Navy Engineering College (PNEC)Call number: 621.3815 BUR (1).
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Integrated circuit manufacturability : the art of process and design integration / edited by Jos⥠Pineda de Gyvez, Dhiraj Pradhan.

by Pineda de Gyvez, Jos⥮ | Pradhan, Dhiraj K | IEEE Circuits and Systems Society.

Publisher: Piscataway, NJ : New York : IEEE Press ; Institute of Electrical and Electronics Engineers, c1999Online access: Contributor biographical information | Publisher description | Table of Contents Availability: Items available for loan: Military College of Signals (MCS)Call number: 621.3815,INT (1).
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Integrated circuit design, fabrication, and test / Peter Shepherd.

by Shepherd, Peter.

Publisher: New York : McGraw-Hill, c1996Online access: Table of contents Availability: Items available for loan: Military College of Signals (MCS)Call number: 621.3815,SHE (1).
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LSI/VLSI testability design / Frank F. Tsui.

by Tsui, Frank F.

Publisher: New York : McGraw-Hill, c1987Availability: Items available for loan: Military College of Signals (MCS)Call number: 621.395,TSU (1).
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Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits-(E-BOOK) Michael L. Bushnell, Vishwani D. Agrawal

by Bushnell, Michael L | Agrawal, Vishwani D.

Publisher: Boston : Kluwer Academic, cop. 2000Availability: Items available for loan: Military College of Signals (MCS)Call number: 621.395 BUS (1).
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RF measurements for cellular phones and wireless data systems -(E-BOOK) Allan W. Scott, Rex Frobenius.

by Scott, Allan W | Frobenius, Rex.

Publisher: Hoboken, N.J. : IEEE : Wiley & Sons, c2008Online access: Publisher description | Table of contents only Availability: Items available for loan: Military College of Signals (MCS)Call number: 621.38456 SCO (1).
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BUILT IN TEST FOR VLSI, PSEUDORANDOM TECHNIQUES

by SAVIR, J, MCANNEY, W. H, BARDELL, PAUL H.

Material type: Text Text Publisher: NWEWYORK JOHN WILEY 1987Availability: Items available for loan: College of Electrical & Mechanical Engineering (CEME)Call number: 621.38173 BAR'B (1).
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